Circuit Design for Reliability (by Gilson Wirth, Yu Cao, Ricardo Reis)


Author(s): Gilson Wirth, Yu Cao, Ricardo Reis

Publisher: Springer
Publish date: 2014-11-08
ISBN-10: 1461440777
ISBN-13: 9781461440772
Language: English
Description: This book presents physical understanding, modeling and simulation,
on-chip characterization, layout solutions, and design techniques
that are effective to enhance the reliability of various circuit
units.  The authors provide readers with techniques for state
of the art and future technologies, ranging from technology
modeling, fault detection and analysis, circuit hardening, and
reliability management.

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