From scientific instrument to industrial machine: Coping with architectural stress in embedded systems (SpringerBriefs in Electrical and Computer Engineering) (by Richard Doornbos, Sjir van Loo)


Author(s): Richard Doornbos, Sjir van Loo

Publisher: Springer
Publish date: 2012-04-29
ISBN-10: 9400741464
ISBN-13: 9789400741461
Language: English
Description:
Architectural stress is the inability of a system design to
respond to new market demands. It is an important yet often
concealed issue in high tech systems. In From scientific
instrument to industrial machine, we look at the phenomenon
of architectural stress in embedded systems in the context of a
transmission electron microscope system built by FEI Company.
Traditionally, transmission electron microscopes are manually
operated scientific instruments, but they also have enormous
potential for use in industrial applications. However, this new
market has quite different characteristics. There are strong
demands for… more…

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